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Prior Year(s):
IEEE LCN-WNM 2006


The Second IEEE LCN Workshop on
Network Measurements  

To be held in conjunction with The 32nd IEEE Conference on Local Computer Networks (LCN 2007) October 15-18, 2007

Dublin, Ireland

The LCN International Workshop on Network Measurements, will be held in conjunction with the IEEE Conference on Local Computer Networks (LCN). The workshop will include papers and panels dealing with latest advances and challenges facing the field. The expected audience will include networking researchers, practitioners, scientists and engineers from industry, academia and government.

The first  IEEE LCN Workshop on Network Measurements was very successful in bringing together a set of participants actively working on network measurements in various domains. This year we will continue with the theme “Network Measurements – Different Perspectives,” to further promote the exchange of knowledge among different network measurement domains.



Topics of Interest:

Network measurements are crucial for operation, diagnosis, and characterization of complex networks. Accurate characterization is important for understanding the behavior of networks and for evaluating the scalability, reliability and performance of protocols. Measurements in wired and wireless domains, and end-to-end and subnet measurements face domain specific constraints while sharing common objectives. Complex dynamics of the networks and also the difficulties in performing measurement itself pose many challenges. This workshop will provide a forum for researchers and practitioners interested in network measurements to discuss and exchange measurement related research in both wireless and wired domains, and also explore emerging fields of measurements such as on mobile devices.

High quality, previously unpublished work is solicited on the topics including, but not limited to:

  • Measurements on homogenous and heterogeneous networks
  • Physical layer characteristics and measurements for wireless networks
  • Implementation and operational challenges of wireless testbeds
  • Mobility models and traffic patterns
  • Wired and wireless domain measurements
  • Measurement tools
  • Bandwidth, capacity and delay estimation
  • Active and passive measurements at core nodes
  • End-to-end and/or application-level measurements over the Internet
  • Metrics for network characterization
  • Benchmark scenarios and data sets
  • Measurements on Mobile devices

Paper length should not exceed 8 pages. Papers should be submitted electronically in PDF format via EDAS (Please refer to conference website for detailed submission instructions). Papers will go through a thorough review process. The accepted papers will appear in the IEEE LCN conference proceedings.

Proposals for panel sessions are also invited. Please send the proposal by the same deadline as for papers.


Important dates

Paper registration: April 23, 2007

Paper submission deadline: April 30, 2007 (11:59 EST)
Notification of acceptance: June 25, 2007
Camera-ready paper due: July 23, 2007

Author Registration due: July 23, 2007


General Chairs:

Prof. Anura P. Jayasumana
Computer Networking Research Laboratory
Department of Electrical & Computer Engineering
Colorado State University
Fort Collins, CO 80523, USA
Anura.Jayasumana@colostate.edu

Dr. Nischal M. Piratla
Deutsche Telekom Laboratories
Ernst-Reuter-Platz 7
10587 Berlin, Germany

Nischal.Piratla@telekom.de

Program Committee:

Falko Dressler            University of Erlangen
Qi Han                       Colorado School of Mines  
Yu-Kwong Kwok      University of Hong Kong    
Maode Ma                 Nanyang Technological University
Daniel Massey            Colorado State University
Antonio Pescape'        University of Naples
Jens-Peter Redlich      Humboldt University Berlin
Henk Uijterwaal          RIPE NCC   
Pablo Vidales             Deutsche Telekom Labs
Bing Wang                 University of Connecticut
Petros Zerfos             Deutsche Telekom Labs     
Beichuan Zhang          University of Arizona
Tanja Zseby               Fraunhofer Institute FOKUS


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